Article ID Journal Published Year Pages File Type
10672623 Ultramicroscopy 2005 12 Pages PDF
Abstract
We propose to produce enhanced images out of given raw data read out by SNOM through (i) improved image formation from the raw data; (ii) wavelet de-noising of the image; and (iii) resolution enhancement by deconvolution. Our methods of improvement are based on refined models for the reduction of noise present in SNOM images and on a linear model for the imaging process. They are successfully demonstrated on (magneto-)optical SNOM images of suitable test samples, but yet they are applicable to other scanning probe microscopy techniques.
Related Topics
Physical Sciences and Engineering Materials Science Nanotechnology
Authors
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