Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
10672626 | Ultramicroscopy | 2005 | 11 Pages |
Abstract
A complementary approach is proposed for analysing series of electron energy-loss spectra that can be recorded with the spectrum-line technique, across an interface for instance. This approach, called blind source separation (BSS) or independent component analysis (ICA), complements two existing methods: the spatial difference approach and multivariate statistical analysis. The principle of the technique is presented and illustrations are given through one simulated example and one real example.
Keywords
Related Topics
Physical Sciences and Engineering
Materials Science
Nanotechnology
Authors
Noël Bonnet, Danielle Nuzillard,