Article ID Journal Published Year Pages File Type
10672626 Ultramicroscopy 2005 11 Pages PDF
Abstract
A complementary approach is proposed for analysing series of electron energy-loss spectra that can be recorded with the spectrum-line technique, across an interface for instance. This approach, called blind source separation (BSS) or independent component analysis (ICA), complements two existing methods: the spatial difference approach and multivariate statistical analysis. The principle of the technique is presented and illustrations are given through one simulated example and one real example.
Related Topics
Physical Sciences and Engineering Materials Science Nanotechnology
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