| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 10672681 | Ultramicroscopy | 2005 | 6 Pages |
Abstract
A simple relocation technique for atomic force microscopy (AFM), which takes advantage of multi-wall carbon nanotube (MWCNT), is used for investigating repeatedly the imaging of some specific species on the whole substrate with a high relocation accuracy of tens of nanometers. As an example of the application of this technique, TappingMode AFM ex situ study of the morphology transition induced by solvent treatment in a triblock copolymer thin film has been carried out.
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Authors
Yongzhi Cao, Yingchun Liang, Shen Dong, You Wang,