| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 10672754 | Ultramicroscopy | 2005 | 9 Pages |
Abstract
A HREM/STEM incorporating aberration correctors in both the probe-forming and imaging lenses has been installed at Oxford University. This unique instrument is also equipped with an in-column energy-loss (Ω-type) filter, HAADF detectors above and beneath the filter, and an EDX system. Initial tests have shown it to be capable of â¼0.1 nm resolution in both TEM and HAADF STEM imaging modes. Some examples of applications are finally presented.
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Authors
John L. Hutchison, John M. Titchmarsh, David J.H. Cockayne, Ron C. Doole, Crispin J.D. Hetherington, Angus I. Kirkland, H. Sawada,