Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
10672785 | Ultramicroscopy | 2005 | 7 Pages |
Abstract
In order to separate the purely optical and topographic information from images in constant-gap mode simultaneously, we proposed the atomic force/photon-scanning tunneling microscopy (AF/PSTM). In this paper, we focus on the principle of separation of the refractive index image from the images of photon-scanning tunneling microscopy. We prove the formula of refractive index imaging by using a three-dimensional finite-difference time-domain method. The formula indicates that the refractive index of a sample is approximately proportional to photon tunneling information (ÎI/I¯)2. From the viewpoint of practical use, we simulated the refractive index images for the realistic experiments. We present line scans along two orthogonal directions and the transmitted intensity as a function of the tip position under the constant-gap mode. The experimental results are presented and are in good agreement with the numerical results.
Related Topics
Physical Sciences and Engineering
Materials Science
Nanotechnology
Authors
Xiaoqiu Wang, Jian zhang, Yinli Li, Guoshu Jian, Wei Suen, Shi Pan, Shifs Wu,