Tomographic imaging based on scattered radiation from polyethylene using 10, 15, 20, 25 and 30Â keV synchrotron X-rays with simple approximations

Tomographic imaging based on scattered radiation from polyethylene (C5H8O2), is evaluated, using 10, 15, 20, 25 and 30 keV synchrotron X-rays. The SYRMEP facility at Elettra, Trieste, Italy, has been used to detect the scattered radiation from the sample at an angle of 90° using Si-Pin detector coupled to a multi-channel analyzer. The contribution of transmitted, Compton and fluorescence photons are assessed from a test phantom of small dimensions with simple approximations. The optimum analysis is performed with the use of the dimensions of the sample by detecting the radiation at various energies.