| Article ID | Journal | Published Year | Pages | File Type | 
|---|---|---|---|---|
| 10707098 | Journal of Crystal Growth | 2012 | 5 Pages | 
Abstract
												⺠Te inclusions are Te-rich CZT melts and contain voids fraction. ⺠Thermomigration velocity of Te inclusions critically depends on its size. ⺠Complex defect of Te antisite and Cd vacancies is reasonable deep-level defect. ⺠Te overpressure annealing does not yield any of the significant structural changes.
											Keywords
												
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											Authors
												K.H. Kim, J. Suh, A.E. Bolotnikov, P.M. Fochuk, O.V. Kopach, G.S. Camarda, Y. Cui, A. Hossain, G. Yang, J. Hong, R.B. James, 
											