Article ID Journal Published Year Pages File Type
10707214 Journal of Crystal Growth 2011 4 Pages PDF
Abstract
We present an in situ measurement method for the precise control of the molecular beam epitaxial growth of microcavities. The method is based on continuous spectral reflectivity measurements and offers the required precision to monitor and control the growth of exactly tuned polariton microcavity structures.
Keywords
Related Topics
Physical Sciences and Engineering Physics and Astronomy Condensed Matter Physics
Preview
Controlled growth of exciton-polariton microcavities using in situ spectral reflectivity measurements
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