Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
10707318 | Journal of Crystal Growth | 2011 | 5 Pages |
Abstract
The phase field modeling (PFM) has emerged as a powerful tool for the simulation of the solidification of polycrystalline alloys. The use of the diffusive interface in PFM allows the treatment of the complicated morphology. However, in dealing with the grain boundary diffusion, it is difficult to simulate the diffusion process that is independent of the interface thickness. To amend this, we propose a model that imbeds a grain boundary diffusion term in the existing adaptive phase field model. In this new model, the simulated solute transport is independent of the interface thickness, and the simulated grain boundary diffusion is in good agreement with the classic solution.
Related Topics
Physical Sciences and Engineering
Physics and Astronomy
Condensed Matter Physics
Authors
S.Y. Yeh, C.C. Chen, C.W. Lan,