Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
10707422 | Journal of Crystal Growth | 2011 | 6 Pages |
Abstract
We carried out calculations to investigate the influence of thermal conductivity of the wall of a crucible on thermal stress and dislocations in a silicon ingot during a solidification process using a three-dimensional global analysis. It was found that the m-c interface shape and the temperature gradient in a silicon ingot have significant influence on thermal stress and dislocations due to different thermal conductivity of the wall of a crucible. Therefore, we should control not only the m-c interface shape, but also temperature gradient in a silicon ingot in order to reduce thermal stress and dislocations in a silicon ingot during a solidification process.
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Authors
X.J. Chen, S. Nakano, K. Kakimoto,