Article ID Journal Published Year Pages File Type
10707763 Journal of Crystal Growth 2005 7 Pages PDF
Abstract
A modified sol-gel method was used to fabricate (Pb0.25Ba0.15Sr0.6)TiO3 (PBST) thin films from the precursor solution with 0, 10 and 27 V% (volume percent) 2-methoxyethanol on a Pt/Ti/SiO/Si substrate. The structural and dielectric properties of PBST thin films were investigated as a function of 2-methoxyethanol concentration in the precursor solution. XRD and SEM analysis showed that we can get pure PBST perovskite phase and relative fine density thin films with smooth surface only using proper concentration (10 V%) of 2-methoxyethanol in the precursor solution. Furthermore, the thin film deposited from precursor with 10 V% 2-methoxyethanol has the highest dielectric constant of 931 and the least loss factor of 0.031 and its tunability and figure of merit (FOM) are 76% and 24.1%, respectively. The results show that the structural and dielectric properties of PBST thin films are strongly dependent on the 2-methoxyethanol in the precursor solution.
Related Topics
Physical Sciences and Engineering Physics and Astronomy Condensed Matter Physics
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