| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 10709423 | Journal of Magnetism and Magnetic Materials | 2012 | 4 Pages |
Abstract
⺠We show record sensitivity of x-ray microscopy in a 1 nm Co effective thickness. ⺠We found extreme sensitivity of the domain structure to number of bilayer repeats. ⺠Perpendicular anisotropy is nearly independent of the number of bilayers. ⺠We have combined Ferromagnetic resonance and high resolution XMCD microscopy.
Keywords
Related Topics
Physical Sciences and Engineering
Physics and Astronomy
Condensed Matter Physics
Authors
F. Macià , P. Warnicke, D. Bedau, M.-Y. Im, P. Fischer, D.A. Arena, A.D. Kent,