| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 10709965 | Journal of Magnetism and Magnetic Materials | 2012 | 8 Pages |
Abstract
⺠Magnetism at interfaces and in thin films is increasingly studied. ⺠X-ray resonant magnetic reflectivity yields the in depth magnetization profile in thin films. ⺠We present a formalism and methodology to study the data. ⺠We illustrate the technique with an example.
Related Topics
Physical Sciences and Engineering
Physics and Astronomy
Condensed Matter Physics
Authors
M. Elzo, E. Jal, O. Bunau, S. Grenier, Y. Joly, A.Y. Ramos, H.C.N. Tolentino, J.M. Tonnerre, N. Jaouen,