Structure and optical features of silicon carbide nanocrystals confined in alumina matrices

Thin films based on silicon carbide and alumina were synthesized by means of rf-sputtering using a co-deposition process. Several nanostructures were created which consist of thin films (∼200 nm thick) with homogeneous distribution of SiC nanocrystals (∼5 nm mean diameter) in the host alumina matrices. Characterization methods including X-ray photoelectrons spectroscopy (XPS), UV-vis absorption and photoluminescence (PL) were used to identify the involved structures, compositions and optical features of these nanostructures. Thus, XPS investigations were relevant to point out the involved chemical bonding in the core SiC nanocrystals and in the host alumina environments. Additionally, mixed bonding such as Si-O-C was also shown and seems to correlate with the SiC-alumina interfaces. Optical properties of the nanostructures films such as UV-vis absorption and photoluminescence (PL) were measured in representative samples and compared to simulated PL responses obtained by a theoretical model.