| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 10716527 | Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment | 2005 | 11 Pages |
Abstract
We present several examples of the applications of a novel microradiology approach based on phase contrast enhancement using unmonochromatized synchrotron X-rays. The approach-mostly implemented and realized at the International Consortium on Phase Contrast Imaging and Radiology (ICPCIR) Beamline at the Pohang Light Source in Korea and on the NSRRC B01A wavelength shifter beamline in Hsinchu, Taiwan, allows the real-time analysis of a variety of phenomena on the micron and submicron scale due to the efficient use of the high-synchrotron X-ray intensity and the coherence. The practical examples concern the examination and investigation of microscopic inhomogeneities, local morphology, etc., in materials science, industrial technology, medicine, the life sciences and other areas.
Related Topics
Physical Sciences and Engineering
Physics and Astronomy
Instrumentation
Authors
Y. Hwu, J.H. Je, G. Margaritondo,