Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
10716537 | Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment | 2005 | 5 Pages |
Abstract
Using a scintillator-CCD imaging system, we successfully conducted a synchrotron white beam Laue topography (WBLT) experiment. It is demonstrated that this approach is able to provide a high-resolution microtopograph of p/p+ Si (1Â 0Â 0). Optimum condition for high-resolution imaging is obtainable from the incident angle dependence of geometrical resolution. Black and white dislocation contrast suggests the potential of WBLT in characterizing dislocation structure.
Related Topics
Physical Sciences and Engineering
Physics and Astronomy
Instrumentation
Authors
J.M. Yi, S.K. Seol, J.H. Je, T.S. Argunova, Y. Hwu, W.-L. Tsai,