Application of the Si-strip detector in X-ray crystallographic texture measurements

The traditional data acquisition method of a pole figure by means of the X-ray diffraction technique is based on the usage of a single-slit detector (point counter) at the fixed 2θ position. However, the examination of the crystallographic texture of multi-phase and low-symmetry materials requires acquiring of wider diffraction spectra, when compared to e.g. one-phase metals. This can be achieved by scanning a selected range of the 2θ angle with the single-slit detector (pseudo-PSD mode) or by applying the position-sensitive (linear) detector, or an area detector. The work presents the application of the linear Si-strip detector in the X'Pert system equipped with texture attachment. Full integration of the new detector with existing hardware created new measurement possibilities and reduced the measurement time. Various examples of measured peak profiles and pole figures are presented.