| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 10716817 | Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment | 2005 | 6 Pages |
Abstract
The problem of optimization of free-standing multilayer films based on Cr/C and Cr/Sc materials for polarization of X-ray radiation with wavelength of 3.14 nm (Ti Lα line) and 4.47 nm (C Kα line) is tackled. An experimental setup for the investigation of polarization properties of the films is described. Experimental data on measured transmission coefficients and polarization degree for Cr/C multilayer films are given.
Related Topics
Physical Sciences and Engineering
Physics and Astronomy
Instrumentation
Authors
S.S. Andreev, M.S. Bibishkin, N.I. Chkhalo, A.Ya. Lopatin, V.I. Luchin, A.E. Pestov, K.A. Prokhorov, N.N. Salaschchenko,