Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
10724831 | Physics Letters B | 2012 | 6 Pages |
Abstract
The secondary scintillation yield, or electroluminescence yield, in the electron avalanches of GEMs and THGEMs operating in gaseous xenon and argon has been determined for different gas pressures. At 1 bar, THGEMs deliver electroluminescence yields that are more than one order of magnitude higher when compared to those achieved in GEMs and two orders of magnitude when compared to those achieved in a uniform field gap. The THGEM electroluminescence yield presents a faster decrease with pressure when comparing to the GEM electroluminescence yield, reaching similar values to what is achieved in GEMs for xenon pressures of 2.5 bar, but still one order of magnitude higher than that produced in a uniform field gap. Another exception is the GEM operating in argon, which presents an electroluminescence yield similar to that produced in a uniform electric field gap, while the THGEM achieves yields that are more than one order of magnitude higher.
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Physical Sciences and Engineering
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Authors
C.M.B. Monteiro, L.M.P. Fernandes, J.F.C.A. Veloso, C.A.B. Oliveira, J.M.F. dos Santos,