Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
10727842 | Physics Letters A | 2013 | 4 Pages |
Abstract
We propose a new method for measuring electron beam profiles using parametric X-ray radiation. In this method, a pinhole is placed between the source of parametric X-ray radiation and a two-dimensional X-ray detector, and the beam profile can be reconstructed on the detector, i.e., based on the principle of a pinhole camera. The profiles are in good agreement with the results obtained using a standard method with optical transition radiation. This method may prove useful to measure profiles of electron beams with short bunch lengths in recent advanced linear accelerators.
Related Topics
Physical Sciences and Engineering
Physics and Astronomy
Physics and Astronomy (General)
Authors
Y. Takabayashi, K. Sumitani,