Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
10729150 | Physics Letters A | 2011 | 6 Pages |
Abstract
Percolation properties and d.c. conductivity were determined for an L2Ãh-random resistor network model of metal-insulator composite films. The effects of the thickness h on the percolation threshold and conductivity were studied numerically in the limit of an infinite size of the L2-plane parallel to the film. For thicknesses ranging from h/L=0.01 to h/L=0.24, a crossover between a finite-size regime and a saturation regime was observed at h/Lâ0.1. In the finite-size regime (h/L⩾0.01), the percolation threshold scales as pc(h)âpc3âhâ1/x, the exponent x being compatible with that of the critical exponent of the 3D correlation length, ν3. The conductivity exponent t appeared to depend linearly on the ratio h/L with a slope νD compatible with 2+ν2, where ν2 is the 2D correlation length exponent. In the saturation regime, a scaling correction for the percolation threshold was found with an exponent 1+1/ν3. In this regime we also observed a logarithmic dependence of the conductivity exponent on h/L.
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Authors
Lotfi Zekri, Ahmed Kaiss, Jean-Pierre Clerc, Bernard Porterie, Nouredine Zekri,