Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
11007106 | Surface and Coatings Technology | 2018 | 31 Pages |
Abstract
To allow direct calorimetric measurement of a high voltage pulsed substrate, a common passive thermal probe (PTP) was modified utilizing a fiber optic temperature sensor. With this probe, the effect of PBII voltage, substrate distance and pressure, on the energy flux and ion current towards the PBII substrate was investigated as a function of the delay between HiPIMS and PBII pulse. The results were successfully compared to a basic model and revealed important information regarding substrate position, process pressure and the effect of secondary electrons in this combined system.
Related Topics
Physical Sciences and Engineering
Materials Science
Nanotechnology
Authors
Sven Gauter, Maik Fröhlich, Holger Kersten,