Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
11031109 | Journal of Physics and Chemistry of Solids | 2019 | 25 Pages |
Abstract
The mechanism for the degradation of phosphor excitation efficiency in flat panel plasma discharge devices was investigated. We found that remaining organic compounds contained in the binders of phosphors were transformed to vacuum ultraviolet (VUV) absorbing substances over prolonged aging, which reduce the excitation efficiency of a phosphor, especially in the shorter wavelength VUV range. We also demonstrated that re-deposition of a sputtered protective layer on a phosphor further reduced the luminescence excitation efficiency due to the absorption of VUV radiation by the layer.
Related Topics
Physical Sciences and Engineering
Materials Science
Electronic, Optical and Magnetic Materials
Authors
Eiji Takeda, Takehiro Zukawa, Tasuku Ishibashi, Kyohei Yoshino, Yukihiro Morita, Minoru Fujii,