Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
1152114 | Statistics & Probability Letters | 2012 | 7 Pages |
Abstract
We study the uniformity of two-level UU-type designs based on the centered and wrap-around L2L2-discrepancies. Based on the known formulation of the measures of uniformity, we present some new lower bounds to centered and wrap-around L2L2-discrepancies, which can be used as benchmarks in searching uniform UU-type designs or helping to proof that a good design is in fact uniform. Using the efficient algorithm proposed in Fang et al. (2003), some two-level uniform designs are obtained.
Related Topics
Physical Sciences and Engineering
Mathematics
Statistics and Probability
Authors
Kashinath Chatterjee, Zhaohai Li, Hong Qin,