| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 1154074 | Statistics & Probability Letters | 2009 | 11 Pages |
Abstract
In the one- and multi-sample cases, in the context of life-testing reliability experiments, we introduce minimal repair processes under a simple step-stress test, based on exponential distributions and an associated cumulative exposure model, and then develop likelihood inference for such a model.
Related Topics
Physical Sciences and Engineering
Mathematics
Statistics and Probability
Authors
N. Balakrishnan, U. Kamps, M. Kateri,