| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 1154389 | Statistics & Probability Letters | 2009 | 5 Pages |
Abstract
A new concept, called silhouette, and the related parameterization are introduced and studied. Applications show how to extend maximally the mean–variance domain of a count distribution, and how to construct a single variable for any mean–variance and any requirements on distribution shape.
Related Topics
Physical Sciences and Engineering
Mathematics
Statistics and Probability
Authors
Per-Erik Hagmark,