A TOF mass spectrometer with higher resolution and sensitivity via elimination of chromatic TOF aberrations of higher orders

- A new ion source for the time-of-flight mass spectrometer is proposed.
- Expressions determining the time-of-flight of ions in such a source were determined.
- Conditions that enable us to eliminate time-of-flight chromatic aberrations in such a source were determined.
- Ion sources with rotational and two-dimensional symmetry were calculated.
- Schemes of time-of-flight mass spectrometers with new ion sources are proposed.