Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
1193988 | International Journal of Mass Spectrometry | 2008 | 6 Pages |
Abstract
Alternating nanometric thin layer films made from poly(diallyldimethylammonium chloride), poly(styrene sulfonate) and montmorillonite clay were analyzed with 26 keV C60+ (433 eV/atom) and 136 keV Au4004+ (340 eV/atom). Secondary ion (SI) emission depth from such thin films was determined to be ∼6–9 nm with C60+ bombardment. Similar depth of emission was also reported with Au4004+ projectile impacts [Z. Li, S.V. Verkhoturov, E.A. Schweikert, Anal. Chem. 78 (2006) 7410]. The SI spectra contain recoiled C60 projectile constituents (m/z = 12, 13, 36). They track the compositional variation of the assembled thin layers except for C− and CH− whose abundances appear to correlate with the presence of metal atoms in the topmost layer.
Related Topics
Physical Sciences and Engineering
Chemistry
Analytical Chemistry
Authors
Zhen Li, Stanislav V. Verkhoturov, Jay E. Locklear, Emile A. Schweikert,