Time of Flight Secondary Ion Mass Spectrometric Determination of Molecular Weight Distributions of Low Polydispersity Poly(Dimethyl Siloxane) with Polyatomic Primary Ions

This work reports a comparison of oligomer and fragment ion intensities resulting from primary ion bombardment with several primary ion sources (Bin+, C60+, and Cs+) at various energies in secondary ion mass spectrometry (SIMS). Although the use of polyatomic primary ions are of great interest due to increased secondary ion efficiency and yield, we demonstrate that monatomic primary ions result in increased oligomer ion yield for polymers prepared as submonolayer films on silver substrates. The enhancement of oligomer secondary ion yield with monatomic ions is evidence that monatomic primary ions have a shallower sampling depth than polyatomic ions, resulting from a collision cascade that is less energetic at the sample surface. The results are also consistent with a lower degree of fragmentation of the resultant secondary ions, which is observed when evaluating the fragmentation data and the spectral data.

Graphical AbstractStacked spectra illustrating secondary ion yield enhancement of high mass silver cationized molecular ions. The authors attribute this to energy deposition in the silver substrate creating a collision cascade the results in “lifting off” of intact polymer chains.Figure optionsDownload full-size imageDownload high-quality image (124 K)Download as PowerPoint slide