Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
1196280 | Journal of the American Society for Mass Spectrometry | 2010 | 8 Pages |
In mass spectrometry imaging, spatial resolution is pushed to its limits with the use of ion microscope mass spectrometric imaging systems. An ion microscope magnifies and then projects the original spatial distribution of ions from a sample surface onto a position-sensitive detector, while retaining time-of-flight mass separation capabilities. Here, a new type of position-sensitive detector based on a chevron microchannel plate stack in combination with a 512 × 512 complementary metal-oxide-semiconductor based pixel detector is coupled to an ion microscope. Spatial resolving power better than 6 μm is demonstrated by secondary ion mass spectrometry and 8–10 μm spatial resolving power is achieved with laser desorption ionization. A detailed evaluation of key performance criteria such as spatial resolution, acquisition speed, and data handling is presented.
Graphical AbstractA new, high resolution mass spectrometry imaging detector approach based on a Medipix pixilated detector in combination with an MCP is presented.Figure optionsDownload full-size imageDownload high-quality image (372 K)Download as PowerPoint slide