Low temperature fabrication and characterization of wurtzite structured ZnS quantum dots by chemical spray pyrolysis

Thin films of zinc sulfide quantum dots are prepared by chemical spray pyrolysis technique. This simple, low cost fabrication technique helps in the formation of uniform, well crystalline thin films. The low temperature formation of ZnS quantum dots with wurtzite phase is confirmed by X-ray diffraction (XRD), scanning electron microscopy (SEM) and transmission electron microscopy (TEM). Energy dispersive X-ray spectroscopy (EDX) is used for the elemental analysis of the prepared film. The various bonds present in the synthesized films are analysed using Fourier transform infrared spectroscopy (FTIR). The various applications of the ZnS thin films such as, an anti-reflector, window layer in photovoltaic devices and phosphor host material in display devices, are confirmed by the characterization tools like UV-vis-NIR spectroscopy and photoluminescence (PL). The film exhibits a blue emission with Commission International d'Eclairage (CIE) coordinates x = 0.13, y = 0.07.