Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
12047147 | Solid State Communications | 2017 | 5 Pages |
Abstract
Measurements of the photoluminescence intensity are presented in a semiconductor microcavity showing the strong coupling regime in the 10-80 K range. In spite of the photoluminescence enhancement in the resonance direction, the results are consistent with an overall excitation decay process essentially insensitive to the microcavity effect. Evidence is also given for a non-thermalization of the excitation in the cavity-polariton dispersion relation at least in this temperature range and large detuning conditions.
Related Topics
Physical Sciences and Engineering
Materials Science
Materials Science (General)
Authors
J. Wainstain, C. Delalande, M. Voos, R. Houdré, R.P. Stanley, U. Oesterle,