| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 1235663 | Spectrochimica Acta Part A: Molecular and Biomolecular Spectroscopy | 2012 | 4 Pages |
Abstract
Polarized micro-Raman measurements are performed to study the phonon modes of N, Li, In, Ga, F and Ag doped ZnO thin films, grown by spray pyrolysis on corning glass substrates. The E2high mode displays a visible asymmetric line shape. The size and dopant dependence onto coupling strength between electron and LO phonon is experimentally estimated.
Graphical abstractFigure optionsDownload full-size imageDownload as PowerPoint slideHighlights► Raman spectra of N, Li, In, Ga, F and Ag doped ZnO thin films. ► Second-order Raman features are discussed in the light of DFT calculations. ► A visible line-shape asymmetry is observed for the E2high mode. ► Size dependent electron and phonon coupling strength.
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Authors
S.S. Shinde, C.H. Bhosale, K.Y. Rajpure,