Article ID Journal Published Year Pages File Type
1236400 Spectrochimica Acta Part A: Molecular and Biomolecular Spectroscopy 2010 6 Pages PDF
Abstract

Bulk single crystals of pure and metal ions (Mn2+, Cu2+ and Ni2+) doped sulphamic acid (SA) have been grown by conventional and unidirectional solution growth methods. Intensities of powder X-ray diffraction peaks of metal ions doped SA reveal that these dopants enhanced the crystallanity. The peak broadening and intensity variation in some frequency regions in FT-IR spectra show the incorporation of dopants in the SA lattice. Mn2+ and Cu2+ doped SA single crystals show high crystalline perfection (FWHM 5.5 arc s) compared to pure and Ni2+ metal ions doped SA crystals. The grown pure and Mn2+, Cu2+ and Ni2+ ions doped SA crystals have transparency in the order SA > Mn:SA > Cu:SA > Ni:SA. The hardness value of Ni2+ doped crystal is relatively less than that of the pure and other metal ions doped SA crystals. Pure and Ni2+ ions doped SA crystals possess high dielectric constants than that of Cu2+ and Mn2+ ions doped crystals. From the SEM micrograph analyses, it is observed that the doping of these metal ions modify the surface morphology of the grown crystals.

Related Topics
Physical Sciences and Engineering Chemistry Analytical Chemistry
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