| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 1240166 | Spectrochimica Acta Part B: Atomic Spectroscopy | 2009 | 12 Pages |
Abstract
A review of Total Reflection X-ray Spectrometry and related methods covering literature of four decades is presented. History, theory, instrumentation, sample preparation, and applications are summarized and some examples are given. New developments and trends are discussed with respect to emerging nano-technologies in all fields of sciences.
Keywords
Related Topics
Physical Sciences and Engineering
Chemistry
Analytical Chemistry
Authors
Alex von Bohlen,