Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
1240876 | Spectrochimica Acta Part B: Atomic Spectroscopy | 2009 | 5 Pages |
Abstract
W/C and Co/SiO2 multilayer laminar-type holographic plane gratings (groove density 1/Ï = 1200 lines/mm) in the 1-8 keV region are developed. For the Co/SiO2 grating the diffraction efficiencies of 0.41 and 0.47 at 4 and 6 keV, respectively, and for the W/C grating 0.38 at 8 keV are observed. Taking advantage of the outstanding high diffraction efficiencies into practical soft X-ray spectrographs a Mo/SiO2 multilayer varied-line-spacing (VLS) laminar-type spherical grating (1/Ï = 2400 lines/mm) is also developed for use with a flat field spectrograph in the region of 1.7 keV. For the Mo/SiO2 multilayer grating the diffraction efficiencies of 0.05-0.20 at 0.9-1.8 keV are observed. The FWHMs of the measured line profiles of Hf-Mα1(1644.6 eV), Si-Kα1(1740.0 eV), and W-Mα1 (1775.4 eV) are 13.7 eV, 8.0 eV, and 8.7 eV, respectively.
Related Topics
Physical Sciences and Engineering
Chemistry
Analytical Chemistry
Authors
Masato Koike, Masahiko Ishino, Takashi Imazono, Kazuo Sano, Hiroyuki Sasai, Masatoshi Hatayama, Hisataka Takenaka, Philip A. Heimann, Eric M. Gullikson,