Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
1241310 | Spectrochimica Acta Part B: Atomic Spectroscopy | 2008 | 4 Pages |
Abstract
New reference materials consisting of cobalt thin films on gold were prepared by sputter deposition. The thickness and homogeneity of the films were characterized using synchrotron radiation micro-XRF. The samples can be used as reference materials to quantify cobalt phthalocyanine and cobalt porphyrin modified gold electrodes which have been analyzed with synchrotron radiation micro-XRF.
Keywords
Related Topics
Physical Sciences and Engineering
Chemistry
Analytical Chemistry
Authors
Annemie Adriaens, Karolien De Wael, David Bogaert, Hans Buschop, Tom Schoonjans, Bart Vekemans, Diederik Depla, Laszlo Vincze,