Article ID Journal Published Year Pages File Type
1241310 Spectrochimica Acta Part B: Atomic Spectroscopy 2008 4 Pages PDF
Abstract

New reference materials consisting of cobalt thin films on gold were prepared by sputter deposition. The thickness and homogeneity of the films were characterized using synchrotron radiation micro-XRF. The samples can be used as reference materials to quantify cobalt phthalocyanine and cobalt porphyrin modified gold electrodes which have been analyzed with synchrotron radiation micro-XRF.

Related Topics
Physical Sciences and Engineering Chemistry Analytical Chemistry
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