| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 1241445 | Spectrochimica Acta Part B: Atomic Spectroscopy | 2007 | 8 Pages |
Abstract
We demonstrate that a thin marker layer, sandwiched in the guiding medium of a thin film planner X-ray waveguide structure, can be used to determine X-ray compression efficiency for a particular excitation mode. It can also be used in evaluating the transmission efficiency of waveguide structure and for the determination of X-ray intensities reaching the waveguide exit. This approach has been applied for determining X-ray compression and transmission efficiency of a Mo/B4C/Mo based X-ray waveguide structure, by inserting a thin Fe marker layer.
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Physical Sciences and Engineering
Chemistry
Analytical Chemistry
Authors
M.K. Tiwari, M. Nayak, G.S. Lodha, R.V. Nandedkar,