Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
1241471 | Spectrochimica Acta Part B: Atomic Spectroscopy | 2006 | 4 Pages |
Abstract
A chemical microchip, which has a flat region on the surface, was recently designed for total reflection X-ray fluorescence (TXRF) analysis. A sample solution was introduced from an inlet by a microsyringe and flowed into a microchannel. Finally it overflowed from the well-type microchannel on the flat region. The sample solution on this region was dried, and then measured by TXRF. The TXRF spectra could be measured with a low background level. This preliminary result indicated that the edge of the well-type channel would not cause a serious problem for TXRF analysis. In addition, a good linear relationship was obtained for Zn Kα in Zn standard solution. This suggests that quantitative analysis by TXRF is feasible in combination with a chemical microchip.
Keywords
Related Topics
Physical Sciences and Engineering
Chemistry
Analytical Chemistry
Authors
Kouichi Tsuji, Yousuke Hanaoka, Akihide Hibara, Manabu Tokeshi, Takehiko Kitamori,