Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
1248247 | TrAC Trends in Analytical Chemistry | 2010 | 18 Pages |
Abstract
Synchrotron radiation-induced total reflection X-ray fluorescence (SR-TXRF) analysis is a high sensitive analytical technique that offers limits of detection in the femtogram range for most elements. Besides the analytical aspect, SR-TXRF is mainly used in combination with angle-dependent measurements and/or X-ray absorption near-edge structure (XANES) spectroscopy to gain additional information about the investigated sample. In this article, we briefly discuss the fundamentals of SR-TXRF and follow with several examples of recent research applying the above-mentioned combination of techniques to analytical problems arising from industrial applications and environmental research.
Keywords
Related Topics
Physical Sciences and Engineering
Chemistry
Analytical Chemistry
Authors
F. Meirer, A. Singh, P. Pianetta, G. Pepponi, F. Meirer, C. Streli, T. Homma,