Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
1253242 | Chemical Research in Chinese Universities | 2007 | 4 Pages |
Abstract
The orientation of the nano-columnar ZnO films grown on sapphire using the technique of metal-organic chemical vapor deposition (MOCVD) exhibits deviation because of the mismatch between the crystal lattices of the films and the sapphire substrate. A high-throughout X-ray diffraction method was employed to determine the crystal orientation of the ZnO films at a time scale of the order of minutes based on the general area detection diffraction system (GADDS). This rapid, effective, and ready method, adapted for characterizing the orientation of the nano-columnar crystals is used to directly explain the results of observation of the X-ray diffraction images, by the measurements of the orientations of the crystal columns of the ZnO films along c-axis and in parallel to ab plane.
Keywords
Related Topics
Physical Sciences and Engineering
Chemistry
Chemistry (General)
Authors
HOU Chang-min, HUANG Ke-ke, GAO Zhong-min, LI Xiang-shan, FENG Shou-hua, ZHANG Yuan-tao, ZHU Hui-chao, DU Guo-tong,