Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
1258829 | Journal of Rare Earths | 2012 | 5 Pages |
Single crystal of Lu2Si2O7:Pr was grown by Czochralski method. Transmittance, photoluminescence excitation (PLE) and photoluminescence (PL) spectra, X-ray excited luminescence (XEL) and fluorescence decay time spectra of the sample were measured and discussed to investigate its optical characteristics. The crystal structure of the as grown Lu2Si2O7:Pr was confirmed to be C2/m. There was a broad absorption peaking at 245 nm in the region from 200â260 nm. The PL spectrum was dominated by fast 3PJâ3HJ band peaking at 524 nm. The XEL spectrum was dominated by the fast 5d14f1â4f2 emission peaking at 265 nm. The 2D (temperature-intensity) and 3D (temperature-wavelength-intensity) thermally stimulated luminescence (TSL) spectra were measured. The Pr3+ ion was found to be the recombination center during the TSL process. Three obvious traps were detected in LPS:Pr single crystal with energy depth at 1.06, 0.78 and 0.67 eV.