Effect of different p-dopants in an interconnection unit on the performance of tandem organic solar cells

•ReO3, MoO3 and CuI are used as p-dopants in the interconnection unit of tandem OPVs.•ReO3, MoO3 and CuI have different charge generation efficiency (CGE).•VOC is affected by the CGE due to the reduction of EF-HOMO level of the p-HTL.•FF is also affected due to the possibility of tunneling process at the Ag/p-HTL.

We report the effect of different p-dopants (ReO3, MoO3 and CuI) used in the interconnection unit (ICU) composed of electron-transporting layer (ETL)/metal/p-doped hole-transporting layer (p-HTL) on the performance of tandem organic photovoltaic (TOPV) cells. Dopants with higher charge generation efficiency resulted in higher open circuit voltage (VOC) due to the reduction of the difference between the Fermi level and the HOMO level of the p-HTL, and higher fill factor (FF) due to the efficient hole transport at the interface between Ag and p-HTL through the tunneling process.

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