Article ID Journal Published Year Pages File Type
1264482 Organic Electronics 2007 6 Pages PDF
Abstract

Fourier transform infrared and photoluminescence spectroscopy provide strong evidence that post-deposition hydrogen doping of polycrystalline zinc oxide (ZnO) thin films improves the resistivity by increasing hydrogen-related shallow donors and hydrogen passivation of native defects. Improvement of the electrical stability and UV emission confirm that post-deposition hydrogen doping is a promising method to achieve high quality ZnO thin films for the use as transparent electrodes and/or UV light emitters in thin-film-based optoelectronic devices.

Related Topics
Physical Sciences and Engineering Chemistry Chemistry (General)
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