Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
1296564 | Solid State Ionics | 2010 | 7 Pages |
Abstract
Platinum/yttria stabilized zirconia (Pt/YSZ) interfaces with two different orientation relationships were characterized using advanced analytical transmission electron microscopy methods. Quantitative X-ray energy dispersive spectroscopy (XEDS) was performed by the recently developed ζ-factor method. Neither interdiffusion nor segregation was detected across the Pt/YSZ interfaces of both orientation conditions within the resolution limit of the technique. The interface specific components of the electron energy-loss near-edge structures (ELNES) were extracted by employing the spatial difference technique. Features of the O-K ELNES at the interface are distinctly different from that at bulk YSZ indicating Pt-O bonding. The experimentally observed changes in the O-K ELNES are in good agreement with the results of ab-initio full multiple scattering calculation, based on structure modeling at the interfaces.
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Authors
V. Srot, M. Watanabe, C. Scheu, P.A. van Aken, U. Salzberger, B. LuerÃen, J. Janek, M. Rühle,