Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
1332849 | Journal of Solid State Chemistry | 2006 | 5 Pages |
Gallium-doped zinc oxide (ZnO:Ga 1, 2, 3, 4 and 5 at%) samples were prepared in powder form by modifying the Pechini method. The formation of zinc gallate (ZnGa2O4) with the spinel crystal structure was observed even in ZnO:Ga 1 at% by X-ray diffraction. The presence of ZnGa2O4 in ZnO:Ga samples was also evidenced by luminescence spectroscopy through its blue emission at 430 nm, assigned to charge transfer between Ga3+ at regular octahedral symmetry and its surrounding O2− ions. The amount of ZnGa2O4 increases as the dopant concentration increases, as observed by the quantitative phase analysis by the Rietveld method.
Graphical abstractZoomed powder X-ray diffraction patterns of pure and gallium-doped zinc oxide samples.Figure optionsDownload full-size imageDownload as PowerPoint slide