X-ray crystallography and chirality: understanding the limitations

Advances in hardware and software have made X-ray crystallography even more attractive as the first-option method for structure analysis. For most organic materials containing up to 100 non-hydrogen atoms, getting from the initial visual examination of the sample to producing publication-ready tables and pictures should usually be achievable in a single morning. Improvements in hardware have also increased reliability of the determination of absolute configuration. A recently published new algorithm may extend the range of applicability of the method.

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