RF-plasma polymerization and characterization of polyaniline

Suitable modifications are done in a RF sputtering set up to facilitate synthesis of polyaniline thin film by RF-plasma polymerization process. The synthesized films are characterized by FTIR, XRD, Ellipsometry, UV–visible absorption & reflection and SEM. The films prepared are highly cross-linked, amorphous in nature and have band gap of 2.07 eV. SEM images show the uniformity in film morphology. The refractive index of the films is determined to be 1.11 and dielectric constant is 1.12 at a wavelength 620 nm in the visible region.

Graphical abstractSuitable modifications are done in a RF sputtering set up to facilitate synthesis of polyaniline thin film by RF-plasma polymerization process. The films prepared are highly cross-linked, amorphous in nature and have band gap of 2.07 eV. SEM images show the uniformity in film morphology. The refractive index of the films is determined to be 1.11 and dielectric constant is 1.12 at a wavelength 620 nm in the visible region.Figure optionsDownload full-size imageDownload as PowerPoint slide