Nano-patterning of through-film conductivity in anisotropic amorphous carbon induced using conductive atomic force microscopy

Direct nanometer patterning of through-film electrical conductivity on carbon films is crucial in the development of carbon materials for nanotechnology. Typically, nanometer topographical surface modification can be created using scanning probe microscopy techniques producing surface artifacts which do not extend through the film. Here, we demonstrate the direct nano-patterning of through-film conductivity on highly oriented anisotropic carbon films by applying single voltage pulses (6 V) to a conductive atomic force tip in contact with the film. The thus induced conductivity is at least four orders of magnitude higher than that of the nominal area.