A local field emission study of partially aligned carbon-nanotubes by atomic force microscope probe

Atomic force microscopy (AFM) was used to study the field emission (FE) properties of a dense array of long and vertically quasi-aligned multi-walled carbon nanotubes grown by catalytic chemical vapor deposition on a silicon substrate. The use of nanometric probes enables local field emission measurements to be made allowing the investigation of effects that are not detectable with a conventional parallel plate setup, where the emission current is averaged over a large sample area. The micrometric inter-electrode distance allows one to achieve high electric fields with a modest voltage. These features made us able to characterize field emission for macroscopic electric fields up to 250 V/μm and attain current densities larger than 105 A/cm2. FE behaviour is analyzed in the framework of the Fowler–Nordheim theory. A field enhancement factor γ ≈ 40–50 and a turn-on field Eturn-on ∼15 V/μm at an inter-electrode distance of 1 μm are estimated. Current saturation observed at high voltages in the I-V characteristics is explained in terms of a series resistance of the order of MΩ. Additional effects, such as electrical conditioning, CNT degradation, response to laser irradiation and time stability are investigated and discussed.